Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections - New York Springer London 2011 - Springer Series in Reliability Engineering .
978-0-85729-310-7
Quality Control, Reliability, Safety and Risk; Computational Intelligence; Electronics and Microelectronics, Instrumentation; Optical and Electronic Materials; Partial Differential Equations
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections - New York Springer London 2011 - Springer Series in Reliability Engineering .
978-0-85729-310-7
Quality Control, Reliability, Safety and Risk; Computational Intelligence; Electronics and Microelectronics, Instrumentation; Optical and Electronic Materials; Partial Differential Equations