Process Variations and Probabilistic Integrated Circuit Design
Manfred Dietrich, Joachim Haase
Process Variations and Probabilistic Integrated Circuit Design - New York Springer US 2012
978-1-4419-6621-6
Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design
Process Variations and Probabilistic Integrated Circuit Design - New York Springer US 2012
978-1-4419-6621-6
Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design