Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs - New York Springer US 2012
978-1-4614-0788-1
Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Nanotechnology and Microengineering
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs - New York Springer US 2012
978-1-4614-0788-1
Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Nanotechnology and Microengineering