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Semiconductor memories : technology, testing and reliability
Material type:
TextPublication details: NULL Institute of Electrical and Electronics Engineers New YorkDescription: xii, 462ISBN: - 9780780310001
- 621.38152 SHA;1 R
| Item type | Current library | Collection | Call number | URL | Status | Barcode | |
|---|---|---|---|---|---|---|---|
Books
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Central Library Central Library | Central Library | 621.38152 SHA;1 R (Browse shelf(Opens below)) | Link to resource | Available | 73830 |
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