APA
(200501). VLSI Design & Embedded Systems : VLSI testing and testability (New Scheme) [e resource : question paper] : First sem MTech Degree Examination, January/February 2005 (LVS151). : VTU.
Chicago
200501. VLSI Design & Embedded Systems : VLSI testing and testability (New Scheme) [e resource : question paper] : First sem MTech Degree Examination, January/February 2005 (LVS151). : VTU.
Harvard
(200501). VLSI Design & Embedded Systems : VLSI testing and testability (New Scheme) [e resource : question paper] : First sem MTech Degree Examination, January/February 2005 (LVS151). : VTU.
MLA
VLSI Design & Embedded Systems : VLSI testing and testability (New Scheme) [e resource : question paper] : First sem MTech Degree Examination, January/February 2005 (LVS151). : VTU. 200501.
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