Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

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TextLanguage: English Series: Frontiers in Electronic TestingPublication details: 2007 Springer US New YorkISBN:

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Item type	Current library	Collection	Vol info	URL	Status	Barcode
E-Books	Central Library Central Library	Central Library	34	Link to resource	Available	EB8072

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