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Lock-in Thermography

By:

Otwin Breitenstein, Wilhelm Warta, Martin Langenkamp

Material type:

TextLanguage: English Series: Springer Series in Advanced MicroelectronicsPublication details: 2010 Springer Berlin Heidelberg New YorkISBN:

978-3-642-02417-7

Subject(s):

Optics, Optoelectronics, Plasmonics and Optical Devices; Characterization and Evaluation of Materials; Engineering, general; Structural Materials

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Holdings
Item type	Current library	Collection	Vol info	URL	Status	Barcode
E-Books	Central Library Central Library	Central Library	10	Link to resource	Available	EB11015

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