Sharma, Ashok K. <br/><br/>
Semiconductor memories : technology, testing and reliability 

 - New York  Institute of Electrical and Electronics Engineers  NULL 
 - xii, 462 
<br/><br/><label>ISBN: </label>9780780310001 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductor,memories,technology,,testing,reliability
<br/><br/><label>Dewey Class. No.: </label>621.38152  SHA;1  R