00777nam a2200169Ia 450000500170000000800410001702000180005808200240007610000210010024500650012126000700018630000130025665000590026994200070032899900190033595202530035420250512122256.0231217s9999    xx            000 0 und d  a9780780310001  a621.38152  SHA;1  R  aSharma, Ashok K. 0aSemiconductor memories : technology, testing and reliability  cNULLbInstitute of Electrical and Electronics EngineersaNew York  axii, 462  aSemiconductor,memories,technology,,testing,reliability  cAA  c188923d188923  r2024-01-26 00:00:00l0o621.38152  SHA;1  Rp73830W25udigital/contents/73830.pdfv5512.50w2024-01-26yAA1040708CL00K[3]:02:00L25/02/2014aMLbMLcCLd2010-09-29eSouthern Book Sellers Southern Booksellerg150.00EECGUSDF49V37.5URupees