TY  - BOOK
TI  - VLSI Design & Embedded Systems : VLSI testing and testability (New Scheme) [e resource : question paper] : First sem MTech Degree Examination, January/February 2005 (LVS151)
U1  - QPECPG05-314 
PY  - 2005////01
PB  - VTU
KW  - Embedded,Systems,(New,Scheme),:,Testing,Testability,[electronic,:,paper],:,Semester,M.Tech.,Degree,Examination,,January/February,2005
KW  - VLSI, Embedded Systems, Testing, Testability
ER  -