Brian S.R. Armstrong, José A. Gutierrez <br/><br/>
Precision Landmark Location for Machine Vision and Photogrammetry 

 - New York  Springer US  2008 
<br/><br/><label>ISBN: </label>978-1-84628-913-2 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Computer Science