TY  - BOOK
AU  - Claus Vielhauer, Jana Dittmann, Andrzej Drygajlo, Niels Christian Juul, Michael C. Fairhurst
TI  - Biometrics and ID Management
SN  - 978-3-642-19530-3
PY  - 2011///
CY  - New York
PB  - Springer US
KW  - Biometrics; Pattern Recognition; Computer Imaging, Vision, Pattern Recognition and Graphics; Image Processing and Computer Vision; Information Storage and Retrieval; Artificial Intelligence (incl. Robotics)
KW  - Computer Science
ER  -