TY  - BOOK
AU  - Jeroen A. Croon, Willy Sansen, Herman E. Maes
TI  - Matching Properties of Deep Sub-Micron MOS Transistors
SN  - 978-0-387-24313-9
PY  - 2005///
CY  - New York
PB  - Springer US
KW  - Circuits and Systems; Physics, general; Electrical Engineering; Electronics and Microelectronics, Instrumentation
ER  -