TY  - BOOK
AU  - E. Suhir, Y. C. Lee, C. P. Wong
TI  - Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging
SN  - 978-0-387-32989-5
PY  - 2007///
CY  - New York
PB  - Springer US
KW  - Electronics and Microelectronics, Instrumentation; Engineering Design; Solid State Physics; Quality Control, Reliability, Safety and Risk
ER  -