Chao Wang, Gary D. Hachtel, Fabio Somenzi <br/><br/>
Abstraction Refinement for Large Scale Model Checking 

 - New York  Springer US  2006 
 - Integrated Circuits and Systems .
<br/><br/><label>ISBN: </label>978-0-387-34600-7 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Electrical Engineering