Manoj Sachdev, José Pineda de Gyvez <br/><br/>
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 

 - New York  Springer US  2007 
 - Frontiers in Electronic Testing .
<br/><br/><label>ISBN: </label>978-0-387-46547-0 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuits and Systems; Electrical Engineering; Engineering Design; Electronics and Microelectronics, Instrumentation