TY  - BOOK
AU  - Manoj Sachdev, José Pineda de Gyvez
TI  - Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
SN  - 978-0-387-46547-0
PY  - 2007///
CY  - New York
PB  - Springer US
KW  - Circuits and Systems; Electrical Engineering; Engineering Design; Electronics and Microelectronics, Instrumentation
ER  -