Telman Aliev <br/><br/>
Digital Noise Monitoring of Defect Origin 

 - New York  Springer US  2007 
<br/><br/><label>ISBN: </label>978-0-387-71754-8 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Signal,Image and Speech Processing; Applications of Mathematics; Communications Engineering, Networks; Electrical Engineering