TY  - BOOK
AU  - Telman Aliev
TI  - Digital Noise Monitoring of Defect Origin
SN  - 978-0-387-71754-8
PY  - 2007///
CY  - New York
PB  - Springer US
KW  - Signal,Image and Speech Processing; Applications of Mathematics; Communications Engineering, Networks; Electrical Engineering
ER  -