Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou <br/><br/>
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections 

 - New York  Springer London  2011 
 - Springer Series in Reliability Engineering .
<br/><br/><label>ISBN: </label>978-0-85729-310-7 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Quality Control, Reliability, Safety and Risk; Computational Intelligence; Electronics and Microelectronics, Instrumentation; Optical and Electronic Materials; Partial Differential Equations