00619nam a2200121Ia 4500008004100000020002200041041001200063100005200075245009200127260003600219440004700255650019500302231221s9999    xx            000 0 und d  a978-0-85729-310-7  aEnglish  aCher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou 0aApplications of Finite Element Methods for Reliability Studies on ULSI Interconnections  c2011bSpringer LondonaNew York  aSpringer Series in Reliability Engineering  aQuality Control, Reliability, Safety and Risk; Computational Intelligence; Electronics and Microelectronics, Instrumentation; Optical and Electronic Materials; Partial Differential Equations