Evgeni Gusev <br/><br/>
Defects in High-k Gate Dielectric Stacks 

 - New York  Springer Netherlands  2006 
 - Nato Science Series II: (closed) .
<br/><br/><label>ISBN: </label>978-1-4020-4367-3 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrical Engineering; Condensed Matter Physics; Electronics and Microelectronics, Instrumentation