TY  - BOOK
AU  - Evgeni Gusev
TI  - Defects in High-k Gate Dielectric Stacks
SN  - 978-1-4020-4367-3
PY  - 2006///
CY  - New York
PB  - Springer Netherlands
KW  - Electrical Engineering; Condensed Matter Physics; Electronics and Microelectronics, Instrumentation
ER  -