Miloa Stanisavljevic, Alexandre Schmid, Yusuf Leblebici <br/><br/>
Reliability of Nanoscale Circuits and Systems 

 - New York  Springer US  2011 
<br/><br/><label>ISBN: </label>978-1-4419-6217-1 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuits and Systems; Quality Control, Reliability, Safety and Risk; Computer-Aided Engineering (CAD, CAE) and Design