TY  - BOOK
AU  - Miloa Stanisavljevic, Alexandre Schmid, Yusuf Leblebici
TI  - Reliability of Nanoscale Circuits and Systems
SN  - 978-1-4419-6217-1
PY  - 2011///
CY  - New York
PB  - Springer US
KW  - Circuits and Systems; Quality Control, Reliability, Safety and Risk; Computer-Aided Engineering (CAD, CAE) and Design
ER  -