Manfred Dietrich, Joachim Haase <br/><br/>
Process Variations and Probabilistic Integrated Circuit Design 

 - New York  Springer US  2012 
<br/><br/><label>ISBN: </label>978-1-4419-6621-6 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design