TY  - BOOK
AU  - Manfred Dietrich, Joachim Haase
TI  - Process Variations and Probabilistic Integrated Circuit Design
SN  - 978-1-4419-6621-6
PY  - 2012///
CY  - New York
PB  - Springer US
KW  - Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design
ER  -