TY  - BOOK
AU  - Tom Proulx
TI  - Optical Measurements, Modeling, and Metrology, Volume 5
SN  - 978-1-4614-0228-2
PY  - 2011///
CY  - New York
PB  - Springer New York
KW  - Appl.Mathematics/Computational Methods of Engineering; Measurement Science and Instrumentation; Characterization and Evaluation of Materials
ER  -