Ruijing Shen, Sheldon X.-D. Tan, Hao Yu <br/><br/>
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs 

 - New York  Springer US  2012 
<br/><br/><label>ISBN: </label>978-1-4614-0788-1 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Nanotechnology and Microengineering