TY  - BOOK
AU  - Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
TI  - Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
SN  - 978-1-4614-0788-1
PY  - 2012///
CY  - New York
PB  - Springer US
KW  - Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Nanotechnology and Microengineering
ER  -