00702nam a2200145Ia 4500008004100000020002200041041001200063100004400075245008800119260003200207650011200239942000700351999001900358952017900377231221s9999    xx            000 0 und d  a978-1-4614-0788-1  aEnglish  aRuijing Shen, Sheldon X.-D. Tan, Hao Yu 0aStatistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs  c2012bSpringer USaNew York  aCircuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Nanotechnology and Microengineering  cEB  c226869d226869  r2024-01-26 00:00:00l0pEB9296uhttp://link.springer.com/openurl?genre=book&isbn=978-1-4614-0787-4w2024-01-26yEB1040708CL00aMLbMLcCLd0000-00-00K19947GRSF1V0W0