Cher Ming Tan, Feifei He <br/><br/>
Electromigration Modeling at Circuit Layout Level 

 - New York  Springer Singapore  2013 
 - SpringerBriefs in Applied Sciences and Technology .
<br/><br/><label>ISBN: </label>978-981-4451-21-5 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Quality Control, Reliability, Safety and Risk; Electronic Circuits and Devices; Atomic, Molecular, Optical and Plasma Physics