00503nam a2200121Ia 4500008004100000020002200041041001200063100002900075245005400104260003900158440005400197650013000251231221s9999    xx            000 0 und d  a978-981-4451-21-5  aEnglish  aCher Ming Tan, Feifei He 0aElectromigration Modeling at Circuit Layout Level  c2013bSpringer SingaporeaNew York  aSpringerBriefs in Applied Sciences and Technology  aQuality Control, Reliability, Safety and Risk; Electronic Circuits and Devices; Atomic, Molecular, Optical and Plasma Physics