TY  - BOOK
AU  - Sharma, Ashok K.
TI  - Semiconductor memories : technology, testing and reliability
SN  - 9788126548378
U1  - 621.38152  SHA;1  R 
PY  - 1997///
CY  - New Delhi
PB  - Wiley Publishing
UR  - digital/contents/73830.pdf
ER  -