000 00460nam a2200133Ia 4500
008 231221s9999 xx 000 0 und d
020 _a978-0-387-71754-8
041 _aEnglish
100 _aTelman Aliev
245 0 _aDigital Noise Monitoring of Defect Origin
260 _c2007
_bSpringer US
_aNew York
650 _aSignal,Image and Speech Processing; Applications of Mathematics; Communications Engineering, Networks; Electrical Engineering
942 _cEB
999 _c225740
_d225740