000			00669nam a2200145Ia 4500
008			231221s9999 xx 000 0 und d
020			_a978-0-85729-310-7
041			_aEnglish
100			_aCher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou
245		0	_aApplications of Finite Element Methods for Reliability Studies on ULSI Interconnections
260			_c2011 _bSpringer London _aNew York
440			_aSpringer Series in Reliability Engineering
650			_aQuality Control, Reliability, Safety and Risk; Computational Intelligence; Electronics and Microelectronics, Instrumentation; Optical and Electronic Materials; Partial Differential Equations
942			_cEB
999			_c225929 _d225929