000			00553nam a2200145Ia 4500
008			231221s9999 xx 000 0 und d
020			_a978-981-4451-21-5
041			_aEnglish
100			_aCher Ming Tan, Feifei He
245		0	_aElectromigration Modeling at Circuit Layout Level
260			_c2013 _bSpringer Singapore _aNew York
440			_aSpringerBriefs in Applied Sciences and Technology
650			_aQuality Control, Reliability, Safety and Risk; Electronic Circuits and Devices; Atomic, Molecular, Optical and Plasma Physics
942			_cEB
999			_c230324 _d230324