Defects in High-k Gate Dielectric Stacks
Evgeni Gusev
Defects in High-k Gate Dielectric Stacks - New York Springer Netherlands 2006 - Nato Science Series II: (closed) .
978-1-4020-4367-3
Electrical Engineering; Condensed Matter Physics; Electronics and Microelectronics, Instrumentation
Defects in High-k Gate Dielectric Stacks - New York Springer Netherlands 2006 - Nato Science Series II: (closed) .
978-1-4020-4367-3
Electrical Engineering; Condensed Matter Physics; Electronics and Microelectronics, Instrumentation