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Defects in High-k Gate Dielectric Stacks

By: Material type: TextLanguage: English Series: Nato Science Series II: (closed)Publication details: 2006 Springer Netherlands New YorkISBN:
  • 978-1-4020-4367-3
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Item type Current library Collection Vol info URL Status Barcode
E-Books Central Library Central Library Central Library 220 Link to resource Available EB8484

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