Results of search for 'se,phr:"Frontiers in Electronic Testing"'

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Introduction to Advanced System-on-Chip Test Design and Optimization by

Erik Larsson

Series: Frontiers in Electronic Testing

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: New York Springer US 2005

Availability: Items available for loan: Central Library (1).

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Fault Diagnosis of Analog Integrated Circuits by

Prithviraj Kabisatpathy, Alok Barua, Satyabroto Sinha

Series: Frontiers in Electronic Testing

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: New York Springer US 2005

Availability: Items available for loan: Central Library (1).

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Data Mining and Diagnosing IC Fails by

Leendert M. Huisman

Series: Frontiers in Electronic Testing

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: New York Springer US 2005

Availability: Items available for loan: Central Library (1).

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Gizopoulos / Advances in ElectronicTesting by

Dimitris Gizopoulos

Series: Frontiers in Electronic Testing

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: New York Springer US 2006

Availability: Items available for loan: Central Library (1).

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Digital Timing Measurements by

Wolfgang Maichen

Series: Frontiers in Electronic Testing

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: New York Springer US 2006

Availability: Items available for loan: Central Library (1).

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The Core Test Wrapper Handbook by

Francisco Silva, Teresa McLaurin, Tom Waayers

Series: Frontiers in Electronic Testing

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: New York Springer US 2006

Availability: Items available for loan: Central Library (1).

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by

Manoj Sachdev, José Pineda de Gyvez

Series: Frontiers in Electronic Testing

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: New York Springer US 2007

Availability: Items available for loan: Central Library (1).

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Emerging Nanotechnologies by

Mohammad Tehranipoor

Series: Frontiers in Electronic Testing

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: New York Springer US 2008

Availability: Items available for loan: Central Library (1).

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Oscillation-Based Test in Mixed-Signal Circuits by

Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz

Series: Frontiers in Electronic Testing

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: New York Springer Netherlands 2006

Availability: Items available for loan: Central Library (1).

10.

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies by

Andrei Pavlov, Manoj Sachdev

Series: Frontiers In Electronic Testing

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: New York Springer Netherlands 2008

Availability: Items available for loan: Central Library (1).

11.

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New Methods of Concurrent Checking by

Michael Göessel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld

Series: Frontiers In Electronic Testing

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: New York Springer Netherlands 2008

Availability: Items available for loan: Central Library (1).

12.

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Soft Errors in Modern Electronic Systems by

Michael Nicolaidis

Series: Frontiers in Electronic Testing

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: New York Springer New York 2011

Availability: Items available for loan: Central Library (1).

13.

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Models in Hardware Testing by

Hans-Joachim Wunderlich

Series: Frontiers in Electronic Testing

Material type:

Text; Format: print ; Literary form: Not fiction

Language: English

Publication details: New York Springer Netherlands 2010

Availability: Items available for loan: Central Library (1).

14.

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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits by

Bushnell, Michael L. Agrawal, Vishwani D

Series: Frontiers in electronic testing

Material type:

Text; Format: print ; Literary form: Not fiction

Publication details: New Delhi Springer 2000

Availability: Items available for loan: Central Library (3)Call number: 621.395 BUS;3, ... Not available: Central Library: Checked out (2).

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Your search returned 14 results.